Our Products

Advanced Failure Analysis and Temperature Measurement Systems for the Semiconductor Industry.

QFI microscopy system with integrated InfraScope and QuantumScope instrumentation on a lab workstation

All Techniques. One System. Maximum Efficiency.

We design and manufacture two families of advanced microscopy systems — InfraScope™ for temperature measurement and QuantumScope™ for failure analysis. Both platforms share the same core design philosophy: multiple analytical techniques on a single system governed by fully integrated software so engineers spend less time moving samples and more time finding answers.

Our systems are trusted by semiconductor manufacturers, research institutions, universities, and failure analysis labs worldwide.

InfraScope™ — Temperature Measurement Microscope Systems

The InfraScope™ platform is the world’s leading temperature measurement microscope solution — with placements across industry and research institutions worldwide. Our heritage in infrared temperature measurement traces back to EDO/Barnes Engineering, the original pioneers in the field.

QuantumScope™ — Failure Analysis Microscope Systems

The QuantumScope™ platform integrates photoemission microscopy, laser signal injection, and infrared hot spot detection on a single multi-sensor system. Set up the device under test once — then switch seamlessly between techniques without disturbing biasing conditions or losing test data.

Supporting Products

Supporting hardware for InfraScope™ and QuantumScope™ systems — thermal stages for precise temperature control, and mechanical platforms built around your lab’s workflow.

QFI logo, white version

Not Sure Where to Start?

Our team can help you identify the right system or service for your application.