Transient-IR captures temperature-versus-time data at 3-microsecond rise time resolution — bringing high-speed transient thermal detection to the InfraScope™ temperature mapping platform.
Transient-IR High-Speed Temperature Trace Option
Transient-IR makes use of an MWIR single-element, high-speed thermal detector targeted at a single point to capture temperature data as a trace plotting temperature-versus-time. As an optional subsystem on the InfraScope™ system, it is optimized for investigation of thermal events transitioning at very fast rates.
Rather than producing a device map, Transient-IR outputs data as temperature-versus-time in an easy-to-interpret oscilloscope format — ideal for applications where speed of thermal change matters as much as spatial distribution.
3µs
Rise Time Resolution
16-bit
Digitization
100 MS/s
Sampling Rate — 100 Megasamples per second digital scope board for high-fidelity temperature trace capture.
Temperature-Versus-Time. In Seconds.
The Transient-IR detector output is fed to a high-gain, high-bandwidth preamp and digitized by a 16-bit, 100 Megasample/second digital scope board. In normal usage, the Transient-IR detector and the 2D MWIR imaging camera are co-aligned, with transient data capture targeted on the center of the temperature map image.
Target the Point of Interest
The single-element MWIR detector is positioned on the center of the InfraScope™ temperature map image — no separate setup required.
Capture the Thermal Event
The detector captures temperature change at very high speed, resolving thermal transitions as fast as 3 microseconds.
Output as Oscilloscope Trace
Temperature-versus-time data is plotted directly on a software-integrated oscilloscope display — fast, clear, and ready for analysis.
Transient-IR High-Speed Temperature Trace Option
Transient-IR uses the same optics and the same measurement setup as the InfraScope™ temperature mapping solution. The Transient-IR software integrates directly with InfraScope™ imaging software — and because the sensors are co-aligned, emissivity correction for the Transient-IR solution is handled automatically.
This seamless integration eliminates extra steps, ensures consistency between techniques, and means our customers can move between 2D thermal mapping and high-speed transient capture without reconfiguring the system.
Transient-IR supports both front side and backside probing, and has proven effective for measuring transient junction temperatures in RF devices and MEMS devices such as ink jet print heads.
Expand Your InfraScope™ Capabilities
InfraScope™ is part of our broader temperature measurement microscopy platform. Depending on your application, you may also want to explore:
Thermoreflectance Imaging
T°Imager™
Thermoreflectance temperature mapping for very high spatial resolution on small features and low temperature rise.
Ready to Add High-Speed Transient Thermal Capture to Your Lab?
Whether you’re adding Transient-IR to an existing InfraScope™ system or evaluating the platform for the first time, our team is here to help you find the right configuration.