Our mechanical platforms are designed to integrate InfraScope™ and QuantumScope™ systems into the specific environment and workflow your application requires — from traditional probe station setups to ATE-docked dynamic analysis configurations.
Platform Flexibility Built Around Your Lab
Both the InfraScope™ and QuantumScope™ system families can be configured with a wide range of sensors and optics to match specific investigation requirements. They can also be integrated onto mechanical platforms designed to support particular application and DUT interface needs.
We design and manufacture our own standard mechanical platforms — a family of solutions that addresses the majority of application requirements encountered in failure analysis and temperature measurement work. When standard configurations don’t meet a customer’s needs, we develop custom mechanical platforms and analytical solutions for those unique requirements.
All QFI systems ship with computer, monitor, and OptoVision software pre-installed and configured. OptoVision is a process-oriented user interface designed to maximize performance with minimal setup time.
Standard Mechanical Platform Configurations
Probe Station Platform
The probe station is our most common configuration for semiconductor failure analysis laboratories. Its ability to interface with a broad range of applications — singulated die, packaged devices, wafer fragments, and full wafers — makes it the practical default for most FA lab environments.
Because we design and manufacture our own probe station, we’re not forced to make tradeoffs for applications outside of failure analysis, IC debug, and temperature measurement. The result is a probe station optimized specifically for these workflows, available in front-side and backside probing configurations, with ergonomics and user access as primary design objectives in the backside option.
- Supports up to 7 sensors
- Automated and manual stage options available
- Light-tight enclosure with flip-up door — standard
- Vibration isolation table — standard
LabWalker™ Platform
The LabWalker™ is our portable platform solution. Its compact footprint — 29″ x 22″ x 44″ tall — allows it to be positioned anywhere convenient, sitting directly on a lab bench, on top of a probe station, adjacent to an ATE test head, or in any lab space where a larger system isn’t practical. The metal frame is designed to keep wiring out of the way, keeping the workspace around the device under test clear and accessible.
For labs that need to use the same system for dynamic XIVA™ LSIM work with an ATE system and for field return analysis in the FA lab, the LabWalker™ is an ideal solution. Its modest size also means additional equipment can be positioned close to the device under test.
- Supports one to three sensors
- Integrated macro lens capability in associated optical heads
- Automated XYZ staging — standard
- Compact 29″ x 22″ x 44″ footprint, designed for lab bench or tester-platform placement
ATE Docking Platforms
Any sensor combination that can be installed into a laboratory or benchtop system can also be installed in a tester-dedicated docking system. QFI’s sensors are housed inside the large blue enclosure, working “upside-down” with the customer’s ATE tester attached on top. ATE docking platforms are designed for dynamic failure analysis investigations — applications where IC failures only manifest in dynamic operating conditions.
Soft Defect Localization (SDL) is one of the primary techniques supported by these systems. In SDL, our XIVA™ LSIM system monitors pass/fail response in a tester loop. Pixel dwell time is synchronized so that the laser dwells on each pixel while test vectors of interest are looped on the device. Pixel location at the moment of pass/fail state change is mapped to the XIVA image — the same way current or voltage changes are tracked in static LSIM applications.
ATE docking solutions are available in two configurations:
- Upright Docking — docks to the test head from above
- Inverted Docking — docks to the test head from below
Some level of customization is involved in docking solutions to ensure proper interface with specific ATE equipment.
Basic Microscope Platform
For straightforward laboratory setups, we can configure single or dual sensor optical heads onto standard microscope platforms. Both manual and programmable stage options are available for these configurations.
Custom Mechanical Platform Design
When a standard platform doesn’t meet your requirements, we’ll design one that does. We work directly with customers whose laboratory environment, DUT interface, or application workflow calls for a non-standard solution — delivering custom mechanical platforms and analytical configurations built around those specific needs.
Not Sure Which Platform Is Right for Your Lab?
Our team can help you identify the right mechanical platform configuration for your instruments, application, and lab environment.